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[IEEE 7th International Conference on Solid-State and Integrated Circuits Technology, 2004. - Beijing, China (Oct. 18-21, 2004)] Proceedings. 7th International Conference on Solid-State and Integrated Circuits Technology, 2004. - The board implementation for checking SEU test on memory devices

[IEEE 7th International Conference on Solid-State and Integrated Circuits Technology, 2004. - Beijing, China (Oct. 18-21, 2004)] Proceedings. 7th International Conference on Solid-State and Integrated Circuits Technology, 2004. - The board implementation for checking SEU test on memory devices

Young Hwan Lho, ; Ki Yup Kim,

作者Young Hwan Lho, ; Ki Yup Kim,
卷第2卷
文件大小1054.58KB
发表时间2004
DOI10.1109/ICSICT.2004.1436639
页码843-846

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