Nonparametric Detection of Correlated Errors
- 期刊名称Biometrika
- 作者Tae Yoon Kim, Donghoh Kim, Byeong U. Park and Douglas G. Simpson
- 卷第91卷
- 期第2期
- 印刷ISSN0006-3444
- 文件大小576.39KB
- 发表时间2004-06
- DOI10.2307/20441115
- 页码491-496
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