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[IEEE 2004 International Semiconductor Conference. CAS 2004 - Sinaia, Romania (4-6 Oct. 2004)] 2004 International Semiconductor Conference. CAS 2004 Proceedings (IEEE Cat. No.04TH8748) - Screening the reliable semiconductor chips by laser acceleration of deep level recombination. Process certification for industrial application

[IEEE 2004 International Semiconductor Conference. CAS 2004 - Sinaia, Romania (4-6 Oct. 2004)] 2004 International Semiconductor Conference. CAS 2004 Proceedings (IEEE Cat. No.04TH8748) - Screening the reliable semiconductor chips by laser acceleration of deep level recombination. Process certification for industrial application

Galateanu, L.; Bazu, M.; Ilian, V.; Tibeica, C.; Petu, A.; Apostol, D.; Damian, V.
  • 作者Galateanu, L.; Bazu, M.; Ilian, V.; Tibeica, C.; Petu, A.; Apostol, D.; Damian, V.
  • 卷第2卷
  • 文件大小349.56KB
  • 发表时间2004
  • DOI10.1109/smicnd.2004.1402999
  • 页码299-302
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