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[IEEE 2004 24th International Conference on Microelectronics - Nis, Serbia (16-19 May 2004)] 2004 24th International Conference on Microelectronics (IEEE Cat. No.04TH8716) - A new model for the breakdown dynamics of ultra-thin gate oxides based on the stochastic logistic differential equation

[IEEE 2004 24th International Conference on Microelectronics - Nis, Serbia (16-19 May 2004)] 2004 24th International Conference on Microelectronics (IEEE Cat. No.04TH8716) - A new model for the breakdown dynamics of ultra-thin gate oxides based on the stochastic logistic differential equation

Miranda, E.; Jimenez, D.

作者Miranda, E.; Jimenez, D.
卷第2卷
文件大小242.05KB
发表时间2004
DOI10.1109/icmel.2004.1314906
页码625-628

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