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[IEEE 2004 International Conference on Microelectronic Test Structures - Awaji Yumebutai, Japan (22-25 March 2004)] Proceedings of the 2004 International Conference on Microelectronic Test Structures (IEEE Cat. No.04CH37516) - Leakage current correction in quasi-static C-V measurements

[IEEE 2004 International Conference on Microelectronic Test Structures - Awaji Yumebutai, Japan (22-25 March 2004)] Proceedings of the 2004 International Conference on Microelectronic Test Structures (IEEE Cat. No.04CH37516) - Leakage current correction in quasi-static C-V measurements

Schmitz, J.; Weusthof, M.H.H.; Hof, A.J.

作者Schmitz, J.; Weusthof, M.H.H.; Hof, A.J.
文件大小209.92KB
发表时间2004
DOI10.1109/ICMTS.2004.1309475
页码179-181

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