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[IEEE Eighth IEEE International Symposium on High Assurance Systems Engineering, 2004. - Tampa, FL, USA (25-26 March 2004)] Eighth IEEE International Symposium on High Assurance Systems Engineering, 2004. Proceedings. - Multi-function system testing:composition of test sets

[IEEE Eighth IEEE International Symposium on High Assurance Systems Engineering, 2004. - Tampa, FL, USA (25-26 March 2004)] Eighth IEEE International Symposium on High Assurance Systems Engineering, 2004. Proceedings. - Multi-function system testing:composition of test sets

Levin, M.Sh.; Last, M.

作者Levin, M.Sh.; Last, M.
文件大小334.81KB
发表时间2004
DOI10.1109/hase.2004.1281734
页码99-108

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