Fast ion millimeter wave collective Thomson scattering diagnostics on TEXTOR and ASDEX upgrades

Michelsen, S.; Korsholm, S. B.; Bindslev, H.; Meo, F.; Michelsen, P. K.; Tsakadze, E. L.; Egedal, J.; Woskov, P.; Hoekzema, J. A.; Leuterer, F.; Westerhof, E.

期刊名称Review of Scientific Instruments
作者Michelsen, S.; Korsholm, S. B.; Bindslev, H.; Meo, F.; Michelsen, P. K.; Tsakadze, E. L.; Egedal, J.; Woskov, P.; Hoekzema, J. A.; Leuterer, F.; Westerhof, E.
卷第75卷
期第10期
印刷ISSN0034-6748
电子ISSN1089-7623
文件大小589.20KB
发表时间2004-10
DOI10.1063/1.1779611
页码3634-3636

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Fast ion millimeter wave collective Thomson scattering diagnostics on TEXTOR and ASDEX upgrades