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The electronic properties of the interface between a thin conjugated oligomer film and SiO2/Si(111), studied by photoemission spectroscopies

The electronic properties of the interface between a thin conjugated oligomer film and SiO2/Si(111), studied by photoemission spectroscopies

V Papaefthimiou; A Siokou; S Kennou
  • 作者V Papaefthimiou; A Siokou; S Kennou
  • 卷第459卷
  • 印刷ISSN0040-6090
  • 文件大小159.39KB
  • 发表时间2004
  • DOI10.1016/j.tsf.2003.12.089
  • 页码32-36
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