Raman Imaging Characterization of Structural and Electrical Properties in 4H SiC
- 期刊名称Materials Science Forum
- 作者Mermoux, Michel; Crisci, Alexandre; Baillet, Francis
- 电子ISSN1662-9752
- 文件大小263.53KB
- 发表时间2004
- DOI10.4028/www.scientific.net/msf.457-460.609
- 页码609-612
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