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SPIE Proceedings [SPIE Optical Systems Design - St. Etienne, France (Tuesday 30 September 2003)] Optical Fabrication, Testing, and Metrology - <title>Optical contacting</title>

SPIE Proceedings [SPIE Optical Systems Design - St. Etienne, France (Tuesday 30 September 2003)] Optical Fabrication, Testing, and Metrology - Optical contacting

Ferme, Jean-Jacques; Geyl, Roland; Rimmer, David; Wang, Lingli

作者Ferme, Jean-Jacques; Geyl, Roland; Rimmer, David; Wang, Lingli
卷第5252卷
印刷ISSN0277-786X
文件大小678.27KB
发表时间2004
DOI10.1117/12.514265
页码26-34

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