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[IEEE The 17th Annual Meeting of the IEEELasers and Electro-Optics Society, 2004. LEOS 2004. - Rio Grande, Puerto Rico (Nov. 8-9, 2004)] The 17th Annual Meeting of the IEEELasers and Electro-Optics Society, 2004. LEOS 2004. - An analyses of return loss in water immersion tests for PC connectors

[IEEE The 17th Annual Meeting of the IEEELasers and Electro-Optics Society, 2004. LEOS 2004. - Rio Grande, Puerto Rico (Nov. 8-9, 2004)] The 17th Annual Meeting of the IEEELasers and Electro-Optics Society, 2004. LEOS 2004. - An analyses of return loss in water immersion tests for PC connectors

Kurokawa, H.; Hazama, R.; Kimura, Y.; Ikuno, S.; Mitachi, S.

作者Kurokawa, H.; Hazama, R.; Kimura, Y.; Ikuno, S.; Mitachi, S.
卷第1卷
文件大小149.45KB
发表时间2004
DOI10.1109/leos.2004.1363299
页码437-438

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