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SPIE Proceedings [SPIE Optical Science and Technology, the SPIE 49th Annual Meeting - Denver, CO (Monday 2 August 2004)] Imaging Spectrometry X - Data processing pipeline for a time-sampled imaging Fourier transform spectrometer

SPIE Proceedings [SPIE Optical Science and Technology, the SPIE 49th Annual Meeting - Denver, CO (Monday 2 August 2004)] Imaging Spectrometry X - Data processing pipeline for a time-sampled imaging Fourier transform spectrometer

Naylor, David A.; Shen, Sylvia S.; Lewis, Paul E.; Fulton, Trevor R.; Davis, Peter W.; Chapman, Ian M.; Gom, Brad G.; Spencer, Locke D.; Lindner, John V.; Nelson-Fitzpatrick, Nathan E.; Tahic, Margaret K.; Davis, Gary R.
  • 作者Naylor, David A.; Shen, Sylvia S.; Lewis, Paul E.; Fulton, Trevor R.; Davis, Peter W.; Chapman, Ian M.; Gom, Brad G.; Spencer, Locke D.; Lindner, John V.; Nelson-Fitzpatrick, Nathan E.; Tahic, Margaret K.; Davis, Gary R.
  • 卷第5546卷
  • 印刷ISSN0277-786X
  • 文件大小811.72KB
  • 发表时间2004
  • DOI10.1117/12.560096
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