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Microstructural characterization of electron beam-physical vapor deposition thermal barrier coatings through high-resolution computed microtomography

Microstructural characterization of electron beam-physical vapor deposition thermal barrier coatings through high-resolution computed microtomography

Anand Kulkarni; Herbert Herman; Francesco DeCarlo; Ramesh Subramanian

作者Anand Kulkarni; Herbert Herman; Francesco DeCarlo; Ramesh Subramanian
卷第35卷
期第7期
印刷ISSN1073-5623
电子ISSN1543-1940
文件大小771.65KB
发表时间2004-07
DOI10.1007/s11661-004-0143-3
页码1945-1952

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