![[IEEE 2010 IEEE Conference on Computer Vision and Pattern Recognition (CVPR) - San Francisco, CA, USA (2010.06.13-2010.06.18)] 2010 IEEE Computer Society Conference on Computer Vision and Pattern Recognition - Sign ambiguity resolution for phase demodulation in interferometry with application to prelens tear film analysis]()
[IEEE 2010 IEEE Conference on Computer Vision and Pattern Recognition (CVPR) - San Francisco, CA, USA (2010.06.13-2010.06.18)] 2010 IEEE Computer Society Conference on Computer Vision and Pattern Recognition - Sign ambiguity resolution for phase demodulation in interferometry with application to prelens tear film analysisWu, Dijia; Boyer, Kim L. · 2010