Behavioral test methods workshop
William Slikker Jr.; Karen Acuff; William K. Boyes; John Chelonis; Kevin M. Crofton; George E. Dearlove; Abby Li; Virginia C. Moser; Chris Newland; John Rossi; Susan Schantz; William Sette; Larry Sheets; Mark Stanton; Shelley Tyl; Thomas J. Sobotka
- 作者William Slikker Jr.; Karen Acuff; William K. Boyes; John Chelonis; Kevin M. Crofton; George E. Dearlove; Abby Li; Virginia C. Moser; Chris Newland; John Rossi; Susan Schantz; William Sette; Larry Sheets; Mark Stanton; Shelley Tyl; Thomas J. Sobotka
- 卷第27卷
- 期第3期
- 印刷ISSN0892-0362
- 文件大小149.41KB
- 发表时间2005
- DOI10.1016/j.ntt.2005.02.003
- 页码417-427