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[IEEE 2005 8th European Conference on Radiation and Its Effects on Components and Systems - Cap d'Agde, France (2005.09.19-2005.09.23)] 2005 8th European Conference on Radiation and Its Effects on Components and Systems - Experimental and 3D Simulation Study on the Role of the Parasitic BJT Activation in SEB/SEGR of Power MOSFET

[IEEE 2005 8th European Conference on Radiation and Its Effects on Components and Systems - Cap d'Agde, France (2005.09.19-2005.09.23)] 2005 8th European Conference on Radiation and Its Effects on Components and Systems - Experimental and 3D Simulation Study on the Role of the Parasitic BJT Activation in SEB/SEGR of Power MOSFET

Porzio, A.; Busatto, G.; Velardi, F.; Iannuzzo, F.; Sanseverino, A.; Curro, G.
  • 作者Porzio, A.; Busatto, G.; Velardi, F.; Iannuzzo, F.; Sanseverino, A.; Curro, G.
  • 文件大小1822.54KB
  • 发表时间2005
  • DOI10.1109/RADECS.2005.4365576
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