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[IEEE IEEE International Conference on Test, 2005. - Charlotte, NC, USA (Nov. 8, 2005)] IEEE International Conference on Test, 2005. - A concurrent bist scheme for on-line/off-line testing based on a pre-computed test set

[IEEE IEEE International Conference on Test, 2005. - Charlotte, NC, USA (Nov. 8, 2005)] IEEE International Conference on Test, 2005. - A concurrent bist scheme for on-line/off-line testing based on a pre-computed test set

Voyiatzis, I.; Gizopoulos, D.; Paschalis, A.; Halatsis, C.

作者Voyiatzis, I.; Gizopoulos, D.; Paschalis, A.; Halatsis, C.
文件大小225.22KB
发表时间2005
DOI10.1109/TEST.2005.1584079
页码1118-1125

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