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[IEEE 2005 IEEE VLSI-TSA International Symposium on VLSI Design, Automation & Test (VLSI-TSA-DAT) - Hsinchu, Taiwan (27-29 April 2005)] 2005 IEEE VLSI-TSA International Symposium on VLSI Design, Automation and Test, 2005. (VLSI-TSA-DAT). - On-chip network evolution using NetC
Liwei Ma, ; Yihe Sun,
- 作者Liwei Ma, ; Yihe Sun,
- 文件大小730.15KB
- 发表时间2005
- DOI10.1109/VDAT.2005.1500067
- 页码249-252
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