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[IEEE IEEE International Radar Conference, 2005. - Arlington, VA, USA (9-12 May 2005)] IEEE International Radar Conference, 2005. - Comparison of recursive and batch processing for impact point prediction of ballistic targets

[IEEE IEEE International Radar Conference, 2005. - Arlington, VA, USA (9-12 May 2005)] IEEE International Radar Conference, 2005. - Comparison of recursive and batch processing for impact point prediction of ballistic targets

Farina, A.; Immediata, S.; Timmoneri, L.; Meloni, M.; Vigilante, D.

作者Farina, A.; Immediata, S.; Timmoneri, L.; Meloni, M.; Vigilante, D.
文件大小280.18KB
发表时间2005
DOI10.1109/radar.2005.1435805
页码121-126

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