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[IEEE Comput. Soc 23rd IEEE VLSI Test Symposium - Palm Springs, CA, USA (1-5 May 2005)] 23rd IEEE VLSI Test Symposium (VTS'05) - An economic selecting model for DFT strategies

[IEEE Comput. Soc 23rd IEEE VLSI Test Symposium - Palm Springs, CA, USA (1-5 May 2005)] 23rd IEEE VLSI Test Symposium (VTS'05) - An economic selecting model for DFT strategies

Yu-Ting Lin, ; Ambler, T.

作者Yu-Ting Lin, ; Ambler, T.
文件大小172.15KB
发表时间2005
DOI10.1109/vts.2005.29
页码412-417

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