[IEEE 2005 IEEE Radio Frequency Integrated Circuits (RFIC) Symposium - Long Beach, CA, USA (12-14 June 2005)] RFIC) Symposium, 2005. Digest of Papers. 2005 IEEE Radio Frequency integrated Circuits - Analysis and modeling of LNA circuit reliability
Enjun Xiao, ; Peiqing Zhu, ; Yuan, J.S.; Chuanzhao Yu,
- 作者Enjun Xiao, ; Peiqing Zhu, ; Yuan, J.S.; Chuanzhao Yu,
- 文件大小575.96KB
- 发表时间2005
- DOI10.1109/rfic.2005.1489499
- 页码69-72