[IEEE IEEE International Conference on Test, 2005. - Charlotte, NC, USA (Nov. 8, 2005)] IEEE International Conference on Test, 2005. - Progressive random access scan: a simultaneous solution to test power, test data volume and test time
- 作者Dong Hyun Baik, ; Saluja, K.K.
- 文件大小288.42KB
- 发表时间2005
- DOI10.1109/test.2005.1583994
- 页码359-368
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