[IEEE IEEE International Conference on Test, 2005. - Charlotte, NC, USA (Nov. 8, 2005)] IEEE International Conference on Test, 2005. - Board and system test with SoC DFT

• 作者Sunter, S.
• 文件大小126.07KB
• 发表时间2005
• DOI10.1109/test.2005.1584098
• 页码1265-1266