[IEEE 2005 8th European Conference on Radiation and Its Effects on Components and Systems - Cap d'Agde, France (2005.09.19-2005.09.23)] 2005 8th European Conference on Radiation and Its Effects on Components and Systems - Evaluation of Reliability and Data Retention of an Irradiated Nonvolatile Memory
Layton, Phil; Longden, Larry; Patnaude, Ed
- 作者Layton, Phil; Longden, Larry; Patnaude, Ed
- 文件大小2159.48KB
- 发表时间2005
- DOI10.1109/radecs.2005.4365649