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[IEEE 2005 8th European Conference on Radiation and Its Effects on Components and Systems - Cap d'Agde, France (2005.09.19-2005.09.23)] 2005 8th European Conference on Radiation and Its Effects on Components and Systems - Evaluation of Reliability and Data Retention of an Irradiated Nonvolatile Memory

[IEEE 2005 8th European Conference on Radiation and Its Effects on Components and Systems - Cap d'Agde, France (2005.09.19-2005.09.23)] 2005 8th European Conference on Radiation and Its Effects on Components and Systems - Evaluation of Reliability and Data Retention of an Irradiated Nonvolatile Memory

Layton, Phil; Longden, Larry; Patnaude, Ed
  • 作者Layton, Phil; Longden, Larry; Patnaude, Ed
  • 文件大小2159.48KB
  • 发表时间2005
  • DOI10.1109/radecs.2005.4365649
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