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Surface roughness in sulfur ion-implanted InP with molecular beam epitaxy regrown double-heterojunction bipolar transistor layers

Surface roughness in sulfur ion-implanted InP with molecular beam epitaxy regrown double-heterojunction bipolar transistor layers

Hu, Ting-Chen; Chang, M. F.; Weimann, Nils; Chen, Jianxin; Chen, Young-Kai
  • 期刊名称Applied Physics Letters
  • 作者Hu, Ting-Chen; Chang, M. F.; Weimann, Nils; Chen, Jianxin; Chen, Young-Kai
  • 卷第86卷
  • 期第14期
  • 印刷ISSN0003-6951
  • 文件大小399.40KB
  • 发表时间2005
  • DOI10.1063/1.1891270
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