Correlation between Si-related and erbium photoluminescence bands and determination of erbium effective excitation cross section in SiO[sub 2] films

Kao, C.-C.; Barthou, C.; Gallas, B.; Fisson, S.; Vuye, G.; Rivory, J.; Al Choueiry, A.; Jurdyc, A.-M.; Jacquier, B.; Bigot, L.

期刊名称Journal of Applied Physics
作者Kao, C.-C.; Barthou, C.; Gallas, B.; Fisson, S.; Vuye, G.; Rivory, J.; Al Choueiry, A.; Jurdyc, A.-M.; Jacquier, B.; Bigot, L.
卷第98卷
期第1期
印刷ISSN0021-8979
文件大小328.90KB
发表时间2005
DOI10.1063/1.1968429

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