发现好书期刊，享受阅读乐趣

海量图书期刊资源，随时随地畅享阅读乐趣

[IEEE Sixth International Symposium on Quality of Electronic Design (ISQED'05) - San Jose, CA, USA (21-23 March 2005)] Sixth International Symposium on Quality of Electronic Design (ISQED'05) - BIST-Guided ATPG

[IEEE Sixth International Symposium on Quality of Electronic Design (ISQED'05) - San Jose, CA, USA (21-23 March 2005)] Sixth International Symposium on Quality of Electronic Design (ISQED'05) - BIST-Guided ATPG

Al-Yamani, A.A.; McCluskey, E.J.

作者Al-Yamani, A.A.; McCluskey, E.J.
文件大小159.51KB
发表时间2005
DOI10.1109/isqed.2005.26
页码244-249

← 返回【学霸图书馆】主页