[IEEE IEEE MTT-S International Microwave Symposium Digest, 2005. - Long Beach, CA, USA (12-17 June 2005)] IEEE MTT-S International Microwave Symposium Digest, 2005. - On the Definition and the Derivation of the Characteristic Parameters of Coupled Lines, and Application to MoM Analysis
Farina, M.; Morini, A.; Rozzi, T.
- 作者Farina, M.; Morini, A.; Rozzi, T.
- 文件大小387.27KB
- 发表时间2005
- DOI10.1109/mwsym.2005.1516524
- 页码75-78