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[IEEE IEEE MTT-S International Microwave Symposium Digest, 2005. - Long Beach, CA, USA (12-17 June 2005)] IEEE MTT-S International Microwave Symposium Digest, 2005. - On the Definition and the Derivation of the Characteristic Parameters of Coupled Lines, and Application to MoM Analysis

[IEEE IEEE MTT-S International Microwave Symposium Digest, 2005. - Long Beach, CA, USA (12-17 June 2005)] IEEE MTT-S International Microwave Symposium Digest, 2005. - On the Definition and the Derivation of the Characteristic Parameters of Coupled Lines, and Application to MoM Analysis

Farina, M.; Morini, A.; Rozzi, T.
  • 作者Farina, M.; Morini, A.; Rozzi, T.
  • 文件大小387.27KB
  • 发表时间2005
  • DOI10.1109/mwsym.2005.1516524
  • 页码75-78
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