[IEEE IEEE International Conference on Test, 2005. - Charlotte, NC, USA (Nov. 8, 2005)] IEEE International Conference on Test, 2005. - IEEE 1500 utilization in SOC design and test

• 作者Zorian, Y.; Yessayan, A.
• 文件大小164.25KB
• 发表时间2005
• DOI10.1109/test.2005.1584015
• 页码543-552