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[IEEE Comput. Soc 23rd IEEE VLSI Test Symposium - Palm Springs, CA, USA (1-5 May 2005)] 23rd IEEE VLSI Test Symposium (VTS'05) - Diagnosis of Arbitrary Defects Using Neighborhood Function Extraction

[IEEE Comput. Soc 23rd IEEE VLSI Test Symposium - Palm Springs, CA, USA (1-5 May 2005)] 23rd IEEE VLSI Test Symposium (VTS'05) - Diagnosis of Arbitrary Defects Using Neighborhood Function Extraction

Rao Desineni, ; Blanton, R.D.

作者Rao Desineni, ; Blanton, R.D.
文件大小284.19KB
发表时间2005
DOI10.1109/vts.2005.41
页码366-373

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