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[IEEE Comput. Soc 23rd IEEE VLSI Test Symposium - Palm Springs, CA, USA (1-5 May 2005)] 23rd IEEE VLSI Test Symposium (VTS'05) - Transition Tests for High Performance Microprocessors

[IEEE Comput. Soc 23rd IEEE VLSI Test Symposium - Palm Springs, CA, USA (1-5 May 2005)] 23rd IEEE VLSI Test Symposium (VTS'05) - Transition Tests for High Performance Microprocessors

Yi-Shing Chang, ; Chakravarty, S.; Hiep Hoang, ; Thorpe, N.; Khen Wee,

作者Yi-Shing Chang, ; Chakravarty, S.; Hiep Hoang, ; Thorpe, N.; Khen Wee,
文件大小136.71KB
发表时间2005
DOI10.1109/vts.2005.87
页码29-34

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