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[IEEE IEEE International Radar Conference, 2005. - Arlington, VA, USA (9-12 May 2005)] IEEE International Radar Conference, 2005. - New target fluctuation models and their experimental validation

[IEEE IEEE International Radar Conference, 2005. - Arlington, VA, USA (9-12 May 2005)] IEEE International Radar Conference, 2005. - New target fluctuation models and their experimental validation

De Maio, A.; Farina, A.; Foglia, G.

作者De Maio, A.; Farina, A.; Foglia, G.
文件大小220.15KB
发表时间2005
DOI10.1109/radar.2005.1435833
页码272-277

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