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[IEEE 31st Annual Conference of IEEE Industrial Electronics Society, 2005. IECON 2005. - Raleigh, NC, USA (2005.11.6-2005.11.6)] 31st Annual Conference of IEEE Industrial Electronics Society, 2005. IECON 2005. - Local 3D map building and error analysis based on stereo vision

[IEEE 31st Annual Conference of IEEE Industrial Electronics Society, 2005. IECON 2005. - Raleigh, NC, USA (2005.11.6-2005.11.6)] 31st Annual Conference of IEEE Industrial Electronics Society, 2005. IECON 2005. - Local 3D map building and error analysis based on stereo vision

Huahua Chen, ; Zezhong Xu,
  • 作者Huahua Chen, ; Zezhong Xu,
  • 文件大小482.47KB
  • 发表时间2005
  • DOI10.1109/iecon.2005.1568934
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