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[IEEE 31st Annual Conference of IEEE Industrial Electronics Society, 2005. IECON 2005. - Raleigh, NC, USA (2005.11.6-2005.11.6)] 31st Annual Conference of IEEE Industrial Electronics Society, 2005. IECON 2005. - Implementation of a low-cost real-time virtue test bed for hardware-in-the-loop testing

[IEEE 31st Annual Conference of IEEE Industrial Electronics Society, 2005. IECON 2005. - Raleigh, NC, USA (2005.11.6-2005.11.6)] 31st Annual Conference of IEEE Industrial Electronics Society, 2005. IECON 2005. - Implementation of a low-cost real-time virtue test bed for hardware-in-the-loop testing

Lu, B.; Wu, X.; Monti, A.

作者Lu, B.; Wu, X.; Monti, A.
文件大小806.10KB
发表时间2005
DOI10.1109/iecon.2005.1568910

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