X-ray absorption spectroscopy in total electron yield mode of scanning photoelectron microscopy
- 作者G.B. Kim; H.J. Song; H.J. Shin; C.K. Hong
- 卷第148卷
- 期第3期
- 印刷ISSN0368-2048
- 文件大小260.15KB
- 发表时间2005
- DOI10.1016/j.elspec.2005.04.005
- 页码137-141
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