SPIE Proceedings [SPIE Electronic Imaging 2005 - San Jose, CA (Monday 17 January 2005)] Image Quality and System Performance II - Application of Tatian"s method to slanted-edge MTF measurement
Burns, Peter D.; Rasmussen, Rene; Miyake, Yoichi
- 作者Burns, Peter D.; Rasmussen, Rene; Miyake, Yoichi
- 卷第5668卷
- 印刷ISSN0277-786X
- 文件大小122.59KB
- 发表时间2005
- DOI10.1117/12.597074
- 页码255-261