SPIE Proceedings [SPIE Smart Structures and Materials - San Diego, CA (Sunday 6 March 2005)] Smart Structures and Materials 2005: Sensors and Smart Structures Technologies for Civil, Mechanical, and Aerospace Systems - Efficient electromechanical (E/M) impedance measuring method for active sensor structural health monitoring
- 作者Xu, Buli; Tomizuka, Masayoshi; Giurgiutiu, Victor
- 卷第5765卷
- 印刷ISSN0277-786X
- 文件大小423.89KB
- 发表时间2005
- DOI10.1117/12.598174
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