SPIE Proceedings [SPIE ICO20:Lasers and Laser Technologies - Changchun, China (Sunday 21 August 2005)] ICO20: Lasers and Laser Technologies - Effect of facet reflectivities on high-power highly strained InGaAs quantum-well diode lasers operating at 1.2 μm
Panchal, C. J.; Kheraj, V. A.; Patel, K. M.; Patel, P. K.; Arora, B. M.; Sharma, T. K.; Chen, Y. C.; Fan, Dianyuan; Gao, Chunqing; Zhou, Shouhuan
- 作者Panchal, C. J.; Kheraj, V. A.; Patel, K. M.; Patel, P. K.; Arora, B. M.; Sharma, T. K.; Chen, Y. C.; Fan, Dianyuan; Gao, Chunqing; Zhou, Shouhuan
- 卷第6028卷
- 印刷ISSN0277-786X
- 文件大小271.32KB
- 发表时间2005
- DOI10.1117/12.667119