SPIE Proceedings [SPIE 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies - Xian, China (Wednesday 2 November 2005)] 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment - Birefringent laterally sheared beam splitter-Savart polariscope
Zhang, Chunmin; Hou, Xun; Yuan, Jiahu; Zhao, Baochang; Xiangli, Bin; Wyant, James C.; Wang, Hexin; Li, Yingcai; Peng, Zhihong; Han, Sen
- 作者Zhang, Chunmin; Hou, Xun; Yuan, Jiahu; Zhao, Baochang; Xiangli, Bin; Wyant, James C.; Wang, Hexin; Li, Yingcai; Peng, Zhihong; Han, Sen
- 卷第6150卷
- 印刷ISSN0277-786X
- 文件大小407.17KB
- 发表时间2005
- DOI10.1117/12.677951