Structural and electrical properties of metal impurities at dislocations in silicon
M. Seibt; V. Kveder; W. Schröter; O. Voß
- 作者M. Seibt; V. Kveder; W. Schröter; O. Voß
- 卷第202卷
- 期第5期
- 印刷ISSN1862-6319
- 文件大小363.27KB
- 发表时间2005
- DOI10.1002/pssa.200460515
- 页码911-920