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SPIE Proceedings [SPIE Electronic Imaging 2005 - San Jose, CA (Monday 17 January 2005)] Image Quality and System Performance II - Exploring s-CIELAB as a scanner metric for print uniformity

SPIE Proceedings [SPIE Electronic Imaging 2005 - San Jose, CA (Monday 17 January 2005)] Image Quality and System Performance II - Exploring s-CIELAB as a scanner metric for print uniformity

Hertel, Dirk W.; Rasmussen, Rene; Miyake, Yoichi

作者Hertel, Dirk W.; Rasmussen, Rene; Miyake, Yoichi
卷第5668卷
印刷ISSN0277-786X
文件大小738.88KB
发表时间2005
DOI10.1117/12.593111

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