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SPIE Proceedings [SPIE Defense and Security - Orlando, Florida, USA (Monday 28 March 2005)] Biometric Technology for Human Identification II - Effects of user correlation on sample size requirements

SPIE Proceedings [SPIE Defense and Security - Orlando, Florida, USA (Monday 28 March 2005)] Biometric Technology for Human Identification II - Effects of user correlation on sample size requirements

Dass, Sarat C.; Jain, Anil K.; Ratha, Nalini K.; Jain, Anil K.

作者Dass, Sarat C.; Jain, Anil K.; Ratha, Nalini K.; Jain, Anil K.
卷第5779卷
印刷ISSN0277-786X
文件大小101.26KB
发表时间2005
DOI10.1117/12.603441

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