[Lecture Notes in Computer Science] Pattern Recognition and Image Analysis Volume 3523 || Leather Inspection Based on Wavelets
Marques, Jorge S.; Pérez de la Blanca, Nicolás; Pina, Pedro
- 作者Marques, Jorge S.; Pérez de la Blanca, Nicolás; Pina, Pedro
- 文件大小487.51KB
- 发表时间2005
- DOI10.1007/11492542_83
- 页码682-688