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Electrically robust ultralong nanowires of NiSi, Ni[sub 2]Si, and Ni[sub 31]Si[sub 12]

Electrically robust ultralong nanowires of NiSi, Ni[sub 2]Si, and Ni[sub 31]Si[sub 12]

Zhang, Zhen; HellstroÌm, Per-Erik; OÌstling, Mikael; Zhang, Shi-Li; Lu, Jun

期刊名称Applied Physics Letters
作者Zhang, Zhen; HellstroÌm, Per-Erik; OÌstling, Mikael; Zhang, Shi-Li; Lu, Jun
卷第88卷
期第4期
印刷ISSN0003-6951
文件大小463.54KB
发表时间2006
DOI10.1063/1.2168017

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