[IEEE IEEE Custom Integrated Circuits Conference 2006 - San Jose, CA, USA (2006.09.10-2006.09.13)] IEEE Custom Integrated Circuits Conference 2006 - Predictive Modeling of the NBTI Effect for Reliable Design
Bhardwaj, Sarvesh; Wang, Wenping; Vattikonda, Rakesh; Cao, Yu; Vrudhula, Sarma
- 作者Bhardwaj, Sarvesh; Wang, Wenping; Vattikonda, Rakesh; Cao, Yu; Vrudhula, Sarma
- 文件大小2735.79KB
- 发表时间2006
- DOI10.1109/CICC.2006.320885
- 页码189-192