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[IEEE Eleventh IEEE European Test Symposium (ETS'06) - Southampton, UK (21-21 May 2006)] Eleventh IEEE European Test Symposium (ETS'06) - A Robust 130nm-CMOS Built-In Current Sensor Dedicated to RF Applications

[IEEE Eleventh IEEE European Test Symposium (ETS'06) - Southampton, UK (21-21 May 2006)] Eleventh IEEE European Test Symposium (ETS'06) - A Robust 130nm-CMOS Built-In Current Sensor Dedicated to RF Applications

Cimino, M.; Lapuyade, H.; De Matos, M.; Taris, T.; Deval, Y.; Begueret, J.B.

作者Cimino, M.; Lapuyade, H.; De Matos, M.; Taris, T.; Deval, Y.; Begueret, J.B.
文件大小412.09KB
发表时间2006
DOI10.1109/ETS.2006.6
页码151-158

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