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[IEEE 2006 International RF and Microwave Conference - Putra Jaya, Malaysia (2006.09.12-2006.09.14)] 2006 International RF and Microwave Conference - Measuring STI Stress Effect on CMOS Transistor by Stepping through the Channel Width

[IEEE 2006 International RF and Microwave Conference - Putra Jaya, Malaysia (2006.09.12-2006.09.14)] 2006 International RF and Microwave Conference - Measuring STI Stress Effect on CMOS Transistor by Stepping through the Channel Width

Tan, Philip Beow Yew; Kordesch, Albert Victor; Ahmad, Wan Rosmaria Wan; Sidek, Othman
  • 作者Tan, Philip Beow Yew; Kordesch, Albert Victor; Ahmad, Wan Rosmaria Wan; Sidek, Othman
  • 文件大小2534.63KB
  • 发表时间2006
  • DOI10.1109/rfm.2006.331063
  • 页码174-176
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