Failure prediction with self organizing maps
Johan Huysmans; Bart Baesens; Jan Vanthienen; Tony van Gestel
- 作者Johan Huysmans; Bart Baesens; Jan Vanthienen; Tony van Gestel
- 卷第30卷
- 期第3期
- 印刷ISSN0957-4174
- 文件大小299.99KB
- 发表时间2006
- DOI10.1016/j.eswa.2005.10.005
- 页码479-487