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[IEEE 2006 Conference on Computer Vision and Pattern Recognition Workshop (CVPRW'06) - New York, NY, USA (17-22 June 2006)] 2006 Conference on Computer Vision and Pattern Recognition Workshop (CVPRW'06) - Using Spatio-Temporal Patches for Simultaneous Estimation of Edge Strength, Orientation, and Motion

[IEEE 2006 Conference on Computer Vision and Pattern Recognition Workshop (CVPRW'06) - New York, NY, USA (17-22 June 2006)] 2006 Conference on Computer Vision and Pattern Recognition Workshop (CVPRW'06) - Using Spatio-Temporal Patches for Simultaneous Estimation of Edge Strength, Orientation, and Motion

Stein, A.N.; Hebert, M.

作者Stein, A.N.; Hebert, M.
文件大小1332.51KB
发表时间2006
DOI10.1109/cvprw.2006.209
页码19-19

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