Xe+-irradiation effects on multilayer thin-film optical surfaces in EUV lithography
J.P. Allain; A. Hassanein; M.M.C. Allain; B.J. Heuser; M. Nieto; C. Chrobak; D. Rokusek; B. Rice
- 作者J.P. Allain; A. Hassanein; M.M.C. Allain; B.J. Heuser; M. Nieto; C. Chrobak; D. Rokusek; B. Rice
- 卷第242卷
- 印刷ISSN0168-583X
- 文件大小121.10KB
- 发表时间2006
- DOI10.1016/j.nimb.2005.08.188
- 页码520-522